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  SrBi2Nb2O9 thin films epitaxially grown on Pt epitaxial bottom layers: structural characteristics and nanoscale characterization of the ferroelectric behaviour by AFM

Duclère, J. R., Guilloux-Viry, M., Bouquet, V., Perrin, A., & Gautier, B. (2004). SrBi2Nb2O9 thin films epitaxially grown on Pt epitaxial bottom layers: structural characteristics and nanoscale characterization of the ferroelectric behaviour by AFM. Annalen der Physik, 13(1-2), 35-38.

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 Creators:
Duclère, J. R.1, Author           
Guilloux-Viry, M., Author
Bouquet, V., Author
Perrin, A., Author
Gautier, B., Author
Affiliations:
1High Magnetic Field Laboratory, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3371774              

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Free keywords: thin films; SrBi2Nb2O9; piezoresponse; AFM
 Abstract: SrBi2Nb2O9 (SBN) films were grown by pulsed laser deposition on (400)
and (110) Pt epitaxial bottom layers. In both cases x-ray diffraction
evidenced the epitaxial growth of SBN in spite of the coexistence of
mainly two orientations. SBN films on (100) Pt present usually a
dominant (001) orientation with the (115) one. AFM piezoresponse images
agree with the crystallographic data, i.e. only the (115) oriented
grains show a piezoelectric contrast. The SBN films grown on (I 10) Pt
lead to a more homogenous piezoresponse imaging, in agreement with the
preferential (116) orientation and the microstructure. (C) 2004
WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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Language(s): eng - English
 Dates: 2004
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 192706
ISI: 000188828900007
 Degree: -

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Title: Annalen der Physik
Source Genre: Journal
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Affiliations:
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Pages: - Volume / Issue: 13 (1-2) Sequence Number: - Start / End Page: 35 - 38 Identifier: ISSN: 0003-3804