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thin films; SrBi2Nb2O9; piezoresponse; AFM
Abstract:
SrBi2Nb2O9 (SBN) films were grown by pulsed laser deposition on (400)
and (110) Pt epitaxial bottom layers. In both cases x-ray diffraction
evidenced the epitaxial growth of SBN in spite of the coexistence of
mainly two orientations. SBN films on (100) Pt present usually a
dominant (001) orientation with the (115) one. AFM piezoresponse images
agree with the crystallographic data, i.e. only the (115) oriented
grains show a piezoelectric contrast. The SBN films grown on (I 10) Pt
lead to a more homogenous piezoresponse imaging, in agreement with the
preferential (116) orientation and the microstructure. (C) 2004
WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.