Temperature dependence of structural parameters in oxide-ion-conducting Nd9.33
(SiO4)6O2: single crystal X-ray studies from 295 to 900 K

Okudera, H.; Yoshiasa, A.; Masubuchi, Y.; Higuchi, M.; Kikkawa, S.

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Temperature dependence of structural parameters in oxide-ion-conducting Nd_9.33(SiO₄)₆O₂: single crystal X-ray studies from 295 to 900 K

Okudera, H., Yoshiasa, A., Masubuchi, Y., Higuchi, M., & Kikkawa, S. (2004). Temperature dependence of structural parameters in oxide-ion-conducting Nd_9.33(SiO₄)₆O₂: single crystal X-ray studies from 295 to 900 K. Journal of Solid State Chemistry, 177(12), 4451-4458.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-F877-5 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-F878-4

Genre: Journal Article

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Creators:
Okudera, H.¹, Author
Yoshiasa, A., Author
Masubuchi, Y., Author
Higuchi, M., Author
Kikkawa, S., Author

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1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502

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Free keywords: neodymium silicate; oxide-ion-conductor; apatite structure type; thermal vibration; X-ray diffraction; single crystal structure analysis; high-temperature experiments

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Language(s): eng - English

Dates: Date issued: 2004

Publication Status: Issued

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Identifiers: eDoc: 217217
ISI: 000226007800010

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Title: Journal of Solid State Chemistry

Source Genre: Journal

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Pages: - Volume / Issue: 177 (12) Sequence Number: - Start / End Page: 4451 - 4458 Identifier: ISSN: 0022-4596