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  Electrical and structural characterization of a low-angle tilt grain boundary in iron-doped strontium titanate

De Souza, R. A., Fleig, J., Maier, J., Kienzle, O., Zhang, Z., Sigle, W., et al. (2003). Electrical and structural characterization of a low-angle tilt grain boundary in iron-doped strontium titanate. Journal of the American Ceramic Society, 86(6), 922-928.

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 Creators:
De Souza, R. A.1, Author           
Fleig, J.1, Author           
Maier, J.1, Author           
Kienzle, O., Author
Zhang, Z., Author
Sigle, W.2, Author           
Rühle, M., Author
Affiliations:
1Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370483              
2Scientific Facility Stuttgart Center for Electron Microscopy (Peter A. van Aken), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370493              

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Language(s): eng - English
 Dates: 2003
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 64757
ISI: 000183499200008
 Degree: -

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Title: Journal of the American Ceramic Society
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 86 (6) Sequence Number: - Start / End Page: 922 - 928 Identifier: ISSN: 0002-7820