Quantitative evaluation of stress-field attenuation in stacks of self-assembled 
Ge islands

Denker, U.; Stoffel, M.; Schmidt, O. G.

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Quantitative evaluation of stress-field attenuation in stacks of self-assembled Ge islands

Denker, U., Stoffel, M., & Schmidt, O. G. (2003). Quantitative evaluation of stress-field attenuation in stacks of self-assembled Ge islands. Applied Physics Letters, 83(7), 1432-1434.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-F0C5-4 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-F0C6-3

Genre: Journal Article

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Creators:
Denker, U.^{1, 2, 3}, Author
Stoffel, M.², Author
Schmidt, O. G.^{1, 2, 3, 4}, Author

Affiliations:
1Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370501
2Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481
3Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370504
4Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370499

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Identifiers: eDoc: 64804
ISI: 000184748600051

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 83 (7) Sequence Number: - Start / End Page: 1432 - 1434 Identifier: ISSN: 0003-6951