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  Direct fabrication of parallel quantum dots with an atomic force microscope

Keyser, U. F., Paesler, M., Zeitler, U., Haug, R. J., & Eberl, K. (2002). Direct fabrication of parallel quantum dots with an atomic force microscope. Physica E, 13(2-4), 1155-1158.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-E443-5 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-E444-4
Genre: Journal Article

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 Creators:
Keyser, U. F., Author
Paesler, M., Author
Zeitler, U., Author
Haug, R. J.1, Author           
Eberl, K.2, Author           
Affiliations:
1Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370504              
2Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370501              

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Free keywords: atomic force microscope; double quantum dots; transport measurements
 Abstract: We demonstrate the stepwise fabrication of parallel double
quantum dots in GaAs/AlGaAs-heterostructures. The atomic force
microscope serves as a direct lithographic tool for the
processing of our samples, The devices are characterized by
transport measurements. Coulomb-blockade oscillations and
diamonds with different periods for the two quantum dots are
observed. (C) 2002 Elsevier Science B.V, All rights reserved.

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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 7155
ISI: 000176869100248
 Degree: -

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Title: Physica E
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 13 (2-4) Sequence Number: - Start / End Page: 1155 - 1158 Identifier: ISSN: 1386-9477