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  Hopping conductivity in heavily doped n-type GaAs layers in the quantum Hall effect regime

Murzin, S. S., Weiss, M., Jansen, A. G. M., & Eberl, K. (2001). Hopping conductivity in heavily doped n-type GaAs layers in the quantum Hall effect regime. Physical Review B, 64(23): 233309.

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 Creators:
Murzin, S. S.1, Author           
Weiss, M.1, Author           
Jansen, A. G. M.1, Author           
Eberl, K.2, Author           
Affiliations:
1High Magnetic Field Laboratory, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3371774              
2Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370501              

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 Abstract: We investigate the magnetoresistance of epitaxially grown,
heavily doped n-type GaAs layers with thickness (40-50 nm)
larger than the electronic mean free path (23 nm). The
temperature dependence of the dissipative resistance R-xx in
the quantum Hall effect regime can be well described by a
hopping law (R-xx proportional to exp{-(T-0/T)(p)}) with p
approximate to0.6. We discuss this result in terms of variable
range hopping in a Coulomb gap together with a dependence of
the electron localization length on the energy in the gap. The
value of the exponent p greater than or equal to0.5 shows that
electron-electron interactions have to be taken into account in
order to explain the occurrence of the quantum Hall effect in
these samples, which have a three-dimensional single electron
density of states.

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Language(s): eng - English
 Dates: 2001
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 7597
ISI: 000172867900026
 Degree: -

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Title: Physical Review B
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 64 (23) Sequence Number: 233309 Start / End Page: - Identifier: ISSN: 0163-1829