In situ monitoring of the low temperature degradation of tetragonal zirconia 
with impedance spectroscopy

Guo, X.

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In situ monitoring of the low temperature degradation of tetragonal zirconia with impedance spectroscopy

Guo, X. (2000). In situ monitoring of the low temperature degradation of tetragonal zirconia with impedance spectroscopy. Advanced Engineering Materials, 2, 604-607.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-E557-E Version Permalink: https://hdl.handle.net/21.11116/0000-000E-E558-D

Genre: Journal Article

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Guo, X.¹, Author

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1Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370483

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Dates: Date issued: 2000

Publication Status: Issued

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Identifiers: eDoc: 181488
Other: 27069

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Title: Advanced Engineering Materials

Source Genre: Journal

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Pages: - Volume / Issue: 2 Sequence Number: - Start / End Page: 604 - 607 Identifier: -