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  Physics and applications of Si/SiGe/Si resonant interband tunneling diodes

Duschl, R., & Eberl, K. (2000). Physics and applications of Si/SiGe/Si resonant interband tunneling diodes. Thin Solid Films, 380, 151-153.

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 Creators:
Duschl, R.1, Author           
Eberl, K.1, Author           
Affiliations:
1Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370501              

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 Dates: 2000
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 181432
Other: 27007
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Title: Thin Solid Films
Source Genre: Journal
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Pages: - Volume / Issue: 380 Sequence Number: - Start / End Page: 151 - 153 Identifier: -