Structural properties of Si-C and Si-Ge-C alloy layers on Si

Eberl, K.; Schmidt, O. G.; Duschl, R.

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Structural properties of Si-C and Si-Ge-C alloy layers on Si

Eberl, K., Schmidt, O. G., & Duschl, R. (2000). Structural properties of Si-C and Si-Ge-C alloy layers on Si. EMIS Datareviews Series, 24, 75-88.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-E60D-1 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-E60E-0

Genre: Journal Article

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Creators:
Eberl, K.¹, Author
Schmidt, O. G.^{1, 2, 3, 4}, Author
Duschl, R.¹, Author

Affiliations:
1Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370501
2Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370499
3Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370504
4Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481

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Dates: Date issued: 2000

Publication Status: Issued

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Identifiers: eDoc: 181437
Other: 27013

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Title: EMIS Datareviews Series

Source Genre: Journal

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Pages: - Volume / Issue: 24 Sequence Number: - Start / End Page: 75 - 88 Identifier: -