Dielectric function of wurtzite GaN and AlN thin films.

Benedict, L. X.; Wethkamp, T.; Wilmers, K.; Cobet, C.; Esser, N.; Shirley, E. L.; Richter, W.; Cardona, M.

Local TagsRelease HistoryDetailsSummary

Dielectric function of wurtzite GaN and AlN thin films.

Benedict, L. X., Wethkamp, T., Wilmers, K., Cobet, C., Esser, N., Shirley, E. L., et al. (1999). Dielectric function of wurtzite GaN and AlN thin films. Solid State Communications, 112, 129-133.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/21.11116/0000-000E-D64E-A Version Permalink: https://hdl.handle.net/21.11116/0000-000E-D64F-9

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Benedict, L. X., Author
Wethkamp, T.¹, Author
Wilmers, K., Author
Cobet, C., Author
Esser, N.¹, Author
Shirley, E. L., Author
Richter, W., Author
Cardona, M.¹, Author

Affiliations:
1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502

Content

show

Details

show

hide

Language(s):

Dates: Date issued: 1999

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 180562
Other: 15337

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Solid State Communications

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 112 Sequence Number: - Start / End Page: 129 - 133 Identifier: -