Optical characterization of Ru2Si3 and Ru2Ge3 by various spectroscopic methods 
and by band structure calculations.

Henrion, W.; Rebien, M.; Antonov, V. N.; Jepsen, O.

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Optical characterization of Ru₂Si₃ and Ru₂Ge₃ by various spectroscopic methods and by band structure calculations.

Henrion, W., Rebien, M., Antonov, V. N., & Jepsen, O. (1999). Optical characterization of Ru₂Si₃ and Ru₂Ge₃ by various spectroscopic methods and by band structure calculations. Solid State Phenomena, 67-68, 471-476.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-D8D6-D Version Permalink: https://hdl.handle.net/21.11116/0000-000E-D8D7-C

Genre: Journal Article

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Creators:
Henrion, W., Author
Rebien, M., Author
Antonov, V. N.¹, Author
Jepsen, O.¹, Author

Affiliations:
1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502

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Dates: Date issued: 1999

Publication Status: Issued

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Identifiers: eDoc: 180752
Other: 15529

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Title: Solid State Phenomena

Source Genre: Journal

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Pages: - Volume / Issue: 67-68 Sequence Number: - Start / End Page: 471 - 476 Identifier: -