An X-ray photoelectron spectroscopy study of novel SiON glasses.

Franke, R.; Girgenrath, C.; Kohn, S.; Jansen, M.

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An X-ray photoelectron spectroscopy study of novel SiON glasses.

Franke, R., Girgenrath, C., Kohn, S., & Jansen, M. (1998). An X-ray photoelectron spectroscopy study of novel SiON glasses. Fresenius Journal of Analytical Chemistry, 361, 587-590.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-E08D-6 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-E08E-5

Genre: Journal Article

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Franke, R., Author
Girgenrath, C., Author
Kohn, S., Author
Jansen, M.¹, Author

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1Abteilung Jansen, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370503

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Dates: Date issued: 1998

Publication Status: Issued

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Identifiers: eDoc: 180689
Other: 15464

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Title: Fresenius Journal of Analytical Chemistry

Source Genre: Journal

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Pages: - Volume / Issue: 361 Sequence Number: - Start / End Page: 587 - 590 Identifier: -