Far infrared ellipsometry using synchrotron radiation: the out-of-plane 
response of La2- xSrxCuO4.

Henn, R. W.; Bernhard, C.; Wittlin, A.; Cardona, M.; Uchida, S.

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Far infrared ellipsometry using synchrotron radiation: the out-of-plane response of La_{2- x}Sr_xCuO₄.

Henn, R. W., Bernhard, C., Wittlin, A., Cardona, M., & Uchida, S. (1998). Far infrared ellipsometry using synchrotron radiation: the out-of-plane response of La_{2- x}Sr_xCuO₄. Thin Solid Films, 313-314, 642-648.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-D64A-E Version Permalink: https://hdl.handle.net/21.11116/0000-000E-D64B-D

Genre: Journal Article

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Creators:
Henn, R. W.¹, Author
Bernhard, C.², Author
Wittlin, A., Author
Cardona, M.³, Author
Uchida, S., Author

Affiliations:
1Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370501
2Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370480
3Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502

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Dates: Date issued: 1998

Publication Status: Issued

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Identifiers: eDoc: 182113
Other: 4415

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Title: Thin Solid Films

Source Genre: Journal

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Pages: - Volume / Issue: 313-314 Sequence Number: - Start / End Page: 642 - 648 Identifier: -