Optical characterization of Ru2Si3 by spectroscopic ellipsometry, UV-VIS-NIR 
spectroscopy and band structure calculations.

Henrion, W.; Rebien, M.; Antonov, V. N.; Jepsen, O.; Lange, H.

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Optical characterization of Ru₂Si₃ by spectroscopic ellipsometry, UV-VIS-NIR spectroscopy and band structure calculations.

Henrion, W., Rebien, M., Antonov, V. N., Jepsen, O., & Lange, H. (1998). Optical characterization of Ru₂Si₃ by spectroscopic ellipsometry, UV-VIS-NIR spectroscopy and band structure calculations. Thin Solid Films, 313-314, 218-221.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-DCA8-D Version Permalink: https://hdl.handle.net/21.11116/0000-000E-DCA9-C

Genre: Journal Article

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Henrion, W., Author
Rebien, M., Author
Antonov, V. N.¹, Author
Jepsen, O.¹, Author
Lange, H., Author

Affiliations:
1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502

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Dates: Date issued: 1998

Publication Status: Issued

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Identifiers: eDoc: 182112
Other: 4417

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Title: Thin Solid Films

Source Genre: Journal

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Pages: - Volume / Issue: 313-314 Sequence Number: - Start / End Page: 218 - 221 Identifier: -