Spectroscopic ellipsometry of AlxGa1-xN in the energy range 3-25 eV.

Wethkamp, T.; Wilmers, K.; Esser, N.; Richter, W.; Ambacher, O.; Angerer, H.; Jungk, G.; Johnson, R. L.; Cardona, M.

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Spectroscopic ellipsometry of Al_xGa_1-xN in the energy range 3-25 eV.

Wethkamp, T., Wilmers, K., Esser, N., Richter, W., Ambacher, O., Angerer, H., et al. (1998). Spectroscopic ellipsometry of Al_xGa_1-xN in the energy range 3-25 eV. Thin Solid Films, 313-314, 745-750.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-D5BA-0 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-D5BB-F

Genre: Journal Article

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Wethkamp, T.¹, Author
Wilmers, K., Author
Esser, N.¹, Author
Richter, W., Author
Ambacher, O., Author
Angerer, H., Author
Jungk, G., Author
Johnson, R. L., Author
Cardona, M.¹, Author

Affiliations:
1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502

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Dates: Date issued: 1998

Publication Status: Issued

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Identifiers: eDoc: 180490
Other: 4820

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Title: Thin Solid Films

Source Genre: Journal

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Pages: - Volume / Issue: 313-314 Sequence Number: - Start / End Page: 745 - 750 Identifier: -