Deposition and characterization of polycrystalline silicon films on glass for 
thin film solar cells.

Wagner, S.; Bergmann, R. B.; Krinke, J.; Strunk, H. P.; Werner, J.

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Deposition and characterization of polycrystalline silicon films on glass for thin film solar cells.

Bergmann, R. B., Krinke, J., Strunk, H. P., & Werner, J. (1997). Deposition and characterization of polycrystalline silicon films on glass for thin film solar cells. In Amorphous and Microcrystalline Silicon Technology - 1997 (pp. 325-330). Pittsburgh: Materials Research Society.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-DD26-F Version Permalink: https://hdl.handle.net/21.11116/0000-000E-DD27-E

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Creators:
Wagner, S., Editor
Bergmann, R. B.¹, Author
Krinke, J., Author
Strunk, H. P., Author
Werner, J., Author

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1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502

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Dates: Date issued: 1997

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Identifiers: eDoc: 182871
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Title: Amorphous and Microcrystalline Silicon Technology - 1997

Source Genre: Book

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Publ. Info: Pittsburgh : Materials Research Society

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 325 - 330 Identifier: -

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Title: Materials Research Society Symposium Proceedings 467

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