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  Observation of deep level defects within the waveguide of red-emitting high-power diode lasers

Ropers, C., Tien, T., Lienau, C., Tomm, J., Brick, P., Linder, N., et al. (2006). Observation of deep level defects within the waveguide of red-emitting high-power diode lasers. Applied Physics Letters, 88(13): 133513. doi:10.1063/1.2190815.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000B-5B5D-8 Version Permalink: https://hdl.handle.net/21.11116/0000-000D-08B7-C
Genre: Journal Article

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Ropers, Claus1, Author                 
Tien, T.Q., Author
Lienau, C., Author
Tomm, J.W., Author
Brick, P., Author
Linder, N., Author
Mayer, B., Author
Müller, M., Author
Tautz, S., Author
Schmid, W., Author
Affiliations:
1Department of Ultrafast Dynamics, MPI for Biophysical Chemistry, Max Planck Society, Göttingen, DE, ou_3371855              

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 Dates: 2006
 Publication Status: Issued
 Pages: -
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 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.2190815
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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 88 (13) Sequence Number: 133513 Start / End Page: - Identifier: ISSN: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223