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  Focusing Through Scattering Materials Using Deep Neural Networks

Vishniakou, I., & Seelig, J. D. (2020). Focusing Through Scattering Materials Using Deep Neural Networks. In Imaging and Applied Optics Congress, OSA Technical Digest. Optica Publishing Group.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000B-F5A4-7 Version Permalink: https://hdl.handle.net/21.11116/0000-000C-1110-E
Genre: Conference Paper

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Locator:
https://opg.optica.org/abstract.cfm?uri=aoms-2020-OTh4B.3 (Abstract)
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 Creators:
Vishniakou, Ivan1, Author           
Seelig, Johannes D.1, Author                 
Affiliations:
1Max Planck Research Group Neural Circuits, Center of Advanced European Studies and Research (caesar), Max Planck Society, ou_2237639              

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Free keywords: -
 Abstract: Neural networks offer novel approaches for light control in microscopy. We compare different deep neural network architectures for focusing through scattering materials for applications in biological imaging.

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Language(s): eng - English
 Dates: 2020-07
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: No review
 Identifiers: -
 Degree: -

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Title: Adaptive Optics: Analysis, Methods & Systems 2020 / Imaging and Applied Optics Congress
Place of Event: Washington, DC, United States
Start-/End Date: 2020-06-22 - 2020-06-26

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Title: Imaging and Applied Optics Congress, OSA Technical Digest
  Other : Adaptive Optics: Analysis, Methods & Systems
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Optica Publishing Group
Pages: - Volume / Issue: - Sequence Number: OTh4B.3 Start / End Page: - Identifier: ISBN: 978-1-943580-77-4