Einführung in die Rasterelektronenmikroskopie

Stroth, U.; Balden, M.; Dörsch, G.; Kärcher, A.

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Einführung in die Rasterelektronenmikroskopie

Stroth, U., Balden, M., Dörsch, G., & Kärcher, A. (2022). Einführung in die Rasterelektronenmikroskopie. Praktikum (WS 2022/2023) (Fortgeschrittene). Technische Universität München, 2022-10-31 - 2023-02-04.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000B-F6C1-5 Version Permalink: https://hdl.handle.net/21.11116/0000-000D-F476-B

Genre: Teaching

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Creators:
Stroth, U.¹, Author
Balden, M.¹, Author
Dörsch, G.¹, Author
Kärcher, A.¹, Author

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): deu - German

Dates: Created: 2022

Publication Status: Not specified

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Identifiers: Other: 1 SWS

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Title: Praktikum (WS 2022/2023) (Fortgeschrittene)

Place of Event: Technische Universität München

Start-/End Date: 2022-10-31 - 2023-02-04

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