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  Label-Descriptive Patterns and Their Application to Characterizing Classification Errors

Hedderich, M. A., Fischer, J., Klakow, D., & Vreeken, J. (2022). Label-Descriptive Patterns and Their Application to Characterizing Classification Errors. In K. Chaudhuri, S. Jegelka, S. Le, S. Csaba, N. Gang, & S. Sabato (Eds.), Proceedings of the 39th International Conference on Machine Learning (pp. 8691-8707). Retrieved from https://proceedings.mlr.press/v162/hedderich22a.html.

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hedderich22a.pdf (Publisher version), 423KB
 
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Proceedings of the 39 th International Conference on Machine Learning, Baltimore, Maryland, USA, PMLR 162, 2022. Copyright 2022 by the author(s)
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 Creators:
Hedderich, Michael A.1, Author
Fischer, Jonas2, Author           
Klakow, Dietrich1, Author
Vreeken, Jilles1, Author           
Affiliations:
1External Organizations, ou_persistent22              
2Databases and Information Systems, MPI for Informatics, Max Planck Society, ou_24018              

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Language(s): eng - English
 Dates: 2022
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: Hedderich_ICML22
URI: https://proceedings.mlr.press/v162/hedderich22a.html
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Title: 39th International Conference on Machine Learning
Place of Event: Baltimore, MA, USA
Start-/End Date: 2022-07-17 - 2022-07-23

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Title: Proceedings of the 39th International Conference on Machine Learning
  Abbreviation : ICML 2022
Source Genre: Proceedings
 Creator(s):
Chaudhuri, Kamalika1, Editor
Jegelka, Stefanie1, Editor
Le, Song1, Editor
Csaba, Szepesvari1, Editor
Gang, Niu1, Editor
Sabato, Sivan1, Editor
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1 External Organizations, ou_persistent22            
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 8691 - 8707 Identifier: -

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Title: Proceedings of the Machine Learning Research
  Abbreviation : PMLR
Source Genre: Series
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Pages: - Volume / Issue: 162 Sequence Number: - Start / End Page: - Identifier: ISSN: 1938-7228