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Free keywords:
Approximation algorithms, Charge carriers, Dispersion (waves), Electron energy loss spectroscopy, Electron scattering, Plasmons, Ruthenium compounds, Strontium compounds, Charge carrier plasmon, Inter-band transition, Long wavelength, Metal systems, Plasmon dispersion, Plasmon excitations, Quantum critical fluctuations, Random phase approximations, Tight binding, Transmission electron energy loss spectroscopies, Energy dissipation
Abstract:
We report on studies of charge carrier plasmon excitations in Sr2RuO4 by transmission electron energy-loss spectroscopy. In particular, we present results on the plasmon dispersion and its width as a function of momentum transfer. The dispersion can be qualitatively explained in the framework of random phase approximation calculations, using an unrenormalized tight-binding band structure. The constant long-wavelength width of the plasmon indicates that it is caused by a decay into interband transitions and not by quantum critical fluctuations. The results from these studies on a prototypical correlated metal system show that the long-wavelength plasmon excitations near 1 eV are caused by resilient quasiparticles and are not influenced by correlation effects. © 2022 American Physical Society.
