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  Bias and synergy in the self-consistent approach of data analysis of ion beam techniques

Silva, T. F., Rodrigues, C. L., Tabacniks, M. H., Toussaint, U. v., & Mayer, M. (2022). Bias and synergy in the self-consistent approach of data analysis of ion beam techniques. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 533, 9-16. doi:10.1016/j.nimb.2022.10.008.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000C-9C04-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0010-0BB2-9
Genre: Journal Article

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 Creators:
Silva, T. F.1, Author
Rodrigues, C. L.1, Author
Tabacniks, M. H.1, Author
Toussaint, U. von2, Author                 
Mayer, M.3, Author                 
Affiliations:
1External Organizations, ou_persistent22              
2Numerical Methods in Plasma Physics (NMPP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856344              
3Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              

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Language(s): eng - English
 Dates: 20222022
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.nimb.2022.10.008
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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  Abbreviation : NIM B
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 533 Sequence Number: - Start / End Page: 9 - 16 Identifier: ISSN: 0168-583X
CoNE: https://pure.mpg.de/cone/journals/resource/954925484704