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  Total ionizing dose test with DEPFET sensors for Athena's WFI

Emberger, V., Bonholzer, M., Müller-Seidlitz, J., & Andritschke, R. (2022). Total ionizing dose test with DEPFET sensors for Athena's WFI. In Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray. doi:10.1117/12.2630048.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000C-9EE8-D Version Permalink: https://hdl.handle.net/21.11116/0000-000C-9EE9-C
Genre: Conference Paper

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 Creators:
Emberger, Valentin1, Author           
Bonholzer, Michael1, Author           
Müller-Seidlitz, Johannes1, Author           
Andritschke, Robert1, Author           
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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 Abstract: The focal plane of Athena’s WFI consists of spectroscopic single photon x-ray detectors that contain arrays of DEPFETs (Depleted P-channel field-effect transistor) as well as ASICs that are used for steering, readout and analog signal shaping. These components have to be examined regarding the effect of ionizing radiation. A total ionizing dose (TID) test was done with prototype detector modules with 64×64 DEPFETs and one SWITCHER and VERITAS ASIC each. The current design of the WFI detector head features a proton shield equivalent to 4 cm of aluminum in order to prevent a strong increase of leakage current in the fully depleted 450 µm thick bulk of the sensor. This keeps the expected doses and dose rates during the nominal mission relatively low (~5 Gy). It is nevertheless important to study the current system in a dedicated TID test in order to exclude unforeseen effects and to study any radiation related changes that can have an effect on the very sensitive readout chain and the detector performance. The combination of low doses, low dose rates, low operating temperature (<-60°C) but high sensitivity on small changes of the threshold voltages represent somehow unusual boundary conditions in comparison to TID tests for standard radiation hard electronic components. Under these circumstances it was found beneficial to do the test in our own laboratory with an x-ray source in order to realize irradiation during nominal operation conditions. Furthermore, it facilitated to take annealing effects into account. Reasonably accurate dosimetry is achieved by measuring the x-ray spectrum and intensity with the device under test. After irradiation to a total dose of 14 Gy and subsequent annealing the threshold voltage of the DEPFETs were shifted by a mean value of 80 mV, the performance remained unchanged apart from a slight increase in readout noise by 10%.

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Language(s): eng - English
 Dates: 2022-08-31
 Publication Status: Published online
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 Identifiers: DOI: 10.1117/12.2630048
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Title: SPIE Astronomical Telescopes + Instrumentation,
Place of Event: Montréal, Québec, Canada
Start-/End Date: 2022-07-17 - 2022-07-23

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Title: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray
Source Genre: Proceedings
 Creator(s):
Nakazawa, Kazuhiro, Author
Nikzad, Shouleh , Author
A. den Herder, Jan-Willem , Author
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Publ. Info: -
Pages: - Volume / Issue: 12181 Sequence Number: - Start / End Page: - Identifier: -

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Title: Proceedings of SPIE
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Publ. Info: Bellingham, WA, USA : Society of Photo-Optical Instrumentation Engineers
Pages: - Volume / Issue: - Sequence Number: 1218142 Start / End Page: - Identifier: ISSN: 0277-786X