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  Athena charged particle diverter simulations: effects of micro-roughness on proton scattering using Geant4

Breuer, J.-P., Galgóczi, G., Fioretti, V., Zlámal, J., Liska, P., Werner, N., et al. (2022). Athena charged particle diverter simulations: effects of micro-roughness on proton scattering using Geant4. In Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray. doi:10.1117/12.2630076.

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 Creators:
Breuer, Jean-Paul, Author
Galgóczi, Gábor, Author
Fioretti, Valentina, Author
Zlámal, Jakub, Author
Liska, Petr, Author
Werner, Norbert, Author
Santin, Giovanni, Author
Boudin, Nathalie, Author
Ferreira, Ivo, Author
Guainazzi, Matteo, Author
Kienlin, Andreas von1, Author           
Lotti, Simone, Author
Mineo, Teresa, Author
Molendi, Silvano, Author
Perinati, Emanuele, Author
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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 Abstract: The last generation of x-ray focusing telescopes operating outside the Earth’s radiation belt discovered that optics were able to focus not only astrophysical x-ray photons, but also low-energy heliophysical protons entering the field of view (FOV). This “soft proton” contamination affects around 40% of the observation time of XMM-Newton. The ATHENA charged particle diverter (CPD) was designed to use magnetic fields to move these soft protons away from the FOV of the detectors, separating the background-contributing ions in the focused beam from the photons of interest. These magnetically deflected protons can hit other parts of the payload and scatter back to the focal plane instruments. Evaluating the impact of this secondary scattering with accurate simulations is essential for the CPD scientific assessment. However, while Geant4 simulations of grazing soft proton scattering on x-ray mirrors have been recently validated, the scattering on the unpolished surfaces of the payload (e.g. the baffle or the diverter itself) is still to be verified with experimental results. Moreover, the roughness structure can affect the energy and angle of the scattered protons, with a scattering efficiency depending on the specific target volume. Using atomic force microscopy to take nanometer-scale surface roughness measurements from different materials and coating samples, we use Geant4 together with the CADMesh library to shoot protons at these very detailed surface roughness models to understand the effects of different material surface roughnesses, coatings, and compositions on proton energy deposition and scattering angles. We compare and validate the simulation results with laboratory experiments, and propose a framework for future proton scattering experiments.

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Language(s): eng - English
 Dates: 2022-08-31
 Publication Status: Published online
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 Identifiers: DOI: 10.1117/12.2630076
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Title: SPIE Astronomical Telescopes + Instrumentation,
Place of Event: Montréal, Québec, Canada
Start-/End Date: 2022-07-17 - 2022-07-23

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Title: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray
Source Genre: Proceedings
 Creator(s):
Nakazawa, Kazuhiro, Author
Nikzad, Shouleh , Author
A. den Herder, Jan-Willem , Author
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Publ. Info: -
Pages: - Volume / Issue: 12181 Sequence Number: - Start / End Page: - Identifier: -

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Title: Proceedings of SPIE
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Publ. Info: Bellingham, WA, USA : Society of Photo-Optical Instrumentation Engineers
Pages: - Volume / Issue: - Sequence Number: 1218143 Start / End Page: - Identifier: ISSN: 0277-786X