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  Optical rectification and electro-optic sampling in quartz

Balos, V., Wolf, M., Kovalev, S., & Sajadi, M. (2023). Optical rectification and electro-optic sampling in quartz. Optics Express, 31(8): 13317. doi:10.48550/arXiv.2209.01153.

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 Creators:
Balos, Vasileios1, Author           
Wolf, Martin1, Author           
Kovalev, Sergey, Author
Sajadi, Mohsen1, Author           
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              

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Free keywords: Physics, Optics, physics.optics, Physics, Instrumentation and Detectors, physics.ins-det
 Abstract: We report electro-optic sampling (EOS) response and terahertz (THz) optical
rectification (OR) in z-cut alpha-quartz. Due to its small effective
second-order nonlinearity, echo-free waveform of intense THz pulses with a few
MV/cm electric-field strength can be measured faithfully with no saturation
effect. Both its OR and EOS responses are broad with extension up to ~8 THz.
Strikingly, the latter responses are independent of the crystal thickness, a
plausible indication of strong surface contribution to the total second-order
nonlinear susceptibility of quartz. Our study introduces thin quartz plates as
the reliable THz electro-optic medium for echo-free, high field THz detection.

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Language(s): eng - English
 Dates: 2022-09-022023-02-202022-11-152023-02-232023-04-10
 Publication Status: Published online
 Pages: 11
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Optics Express
  Abbreviation : Opt. Express
Source Genre: Journal
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Publ. Info: Washington, DC : Optical Society of America
Pages: 11 Volume / Issue: 31 (8) Sequence Number: 13317 Start / End Page: - Identifier: ISSN: 1094-4087
CoNE: https://pure.mpg.de/cone/journals/resource/954925609918