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  Subspace Modeling for Fast and High-sensitivity X-ray Chemical Imaging

Li, J., Chen, B., Zan, G., Qian, G., Pianetta, P., & Liu, Y. (2022). Subspace Modeling for Fast and High-sensitivity X-ray Chemical Imaging. Retrieved from https://arxiv.org/abs/2201.00259.

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arXiv:2201.00259.pdf (Preprint), 7MB
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 Creators:
Li, Jizhou1, Author
Chen, Bin2, Author           
Zan, Guibin1, Author
Qian, Guannan1, Author
Pianetta, Piero1, Author
Liu, Yijin1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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Free keywords: eess.IV,Computer Science, Computer Vision and Pattern Recognition, cs.CV,Computer Science, Multimedia, cs.MM
 Abstract: Resolving morphological chemical phase transformations at the nanoscale is of
vital importance to many scientific and industrial applications across various
disciplines. The TXM-XANES imaging technique, by combining full field
transmission X-ray microscopy (TXM) and X-ray absorption near edge structure
(XANES), has been an emerging tool which operates by acquiring a series of
microscopy images with multi-energy X-rays and fitting to obtain the chemical
map. Its capability, however, is limited by the poor signal-to-noise ratios due
to the system errors and low exposure illuminations for fast acquisition. In
this work, by exploiting the intrinsic properties and subspace modeling of the
TXM-XANES imaging data, we introduce a simple and robust denoising approach to
improve the image quality, which enables fast and high-sensitivity chemical
imaging. Extensive experiments on both synthetic and real datasets demonstrate
the superior performance of the proposed method.

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Language(s): eng - English
 Dates: 2022-01-012022
 Publication Status: Published online
 Pages: 10 p.
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: arXiv: 2201.00259
URI: https://arxiv.org/abs/2201.00259
BibTex Citekey: li2022subspace
 Degree: -

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