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  Fast and Memory-Efficient Significant Pattern Mining via Permutation Testing

Llinares-López, F., Sugiyama, M., Papaxanthos, L., & Borgwardt, K. (2015). Fast and Memory-Efficient Significant Pattern Mining via Permutation Testing. KDD '15: The 21th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, 725-734. doi:10.1145/2783258.2783363.

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 Creators:
Llinares-López, Felipe, Author
Sugiyama, Mahito, Author
Papaxanthos, Laetitia, Author
Borgwardt, Karsten1, Author                 
Affiliations:
1ETH Zürich, ou_persistent22              

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 Dates: 2015-08-102015
 Publication Status: Issued
 Pages: 725-734
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1145/2783258.2783363
ISBN: 978-1-4503-3664-2
 Degree: -

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Title: KDD '15: The 21th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 725 - 734 Identifier: -