Significant Subgraph Mining with Multiple Testing Correction

Sugiyama, Mahito; López, Felipe Llinares; Kasenburg, Niklas; Borgwardt, Karsten

doi:10.1137/1.9781611974010.5

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Significant Subgraph Mining with Multiple Testing Correction

Sugiyama, M., López, F. L., Kasenburg, N., & Borgwardt, K. (2015). Significant Subgraph Mining with Multiple Testing Correction. Proceedings of the 2015 SIAM International Conference on Data Mining (SDM), 37-45. doi:10.1137/1.9781611974010.5.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000C-F2F5-E Version Permalink: https://hdl.handle.net/21.11116/0000-000D-D3EC-B

Genre: Journal Article

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Creators:
Sugiyama, Mahito, Author
López, Felipe Llinares, Author
Kasenburg, Niklas, Author
Borgwardt, Karsten¹, Author

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1ETH Zürich, ou_persistent22

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Dates: Published Online: 2015-07-21Date issued: 2015

Publication Status: Issued

Pages: 37-45

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Identifiers: DOI: 10.1137/1.9781611974010.5
ISBN: 978-1-61197-401-0

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Title: Proceedings of the 2015 SIAM International Conference on Data Mining (SDM)

Source Genre: Journal

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 37 - 45 Identifier: -