Unsupervised clustering of nanoindentation data for microstructural 
reconstruction: Challenges in phase discrimination

Jentner, Robin; Srivastava, Kinshuk; Scholl , Sebastian; Gallardo-Basile, Francisco-José; Best, James P.; Kirchlechner, Christoph; Dehm, Gerhard

doi:10.1016/j.mtla.2023.101750

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Unsupervised clustering of nanoindentation data for microstructural reconstruction: Challenges in phase discrimination

Jentner, R., Srivastava, K., Scholl, S., Gallardo-Basile, F.-J., Best, J. P., Kirchlechner, C., et al. (2023). Unsupervised clustering of nanoindentation data for microstructural reconstruction: Challenges in phase discrimination. Materialia, 28: 101750. doi:10.1016/j.mtla.2023.101750.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000D-037A-7 Version Permalink: https://hdl.handle.net/21.11116/0000-000D-037B-6

Genre: Journal Article

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Creators:
Jentner, Robin¹, Author
Srivastava, Kinshuk², Author
Scholl , Sebastian², Author
Gallardo-Basile, Francisco-José³, Author
Best, James P.^{1, 4}, Author
Kirchlechner, Christoph^{1, 5}, Author
Dehm, Gerhard⁶, Author

Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
2AG der Dillinger Hüttenwerke, Werkstraße 1, Dillingen/Saar 66763, Germany, ou_persistent22
3Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392
4Thin Films and Nanostructured Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_3274276
5Institute for Applied Materials (IAM-WBM), Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen D-76344, Germany, ou_persistent22
6Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Date issued: 2023-05

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: Peer

Identifiers: DOI: 10.1016/j.mtla.2023.101750

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Title: Materialia

Abbreviation : Materialia

Source Genre: Journal

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Publ. Info: Elsevier Ltd.

Pages: - Volume / Issue: 28 Sequence Number: 101750 Start / End Page: - Identifier: ISSN: 2589-1529
CoNE: https://pure.mpg.de/cone/journals/resource/2589-1529