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  Multilayer patent citation networks: A comprehensive analytical framework for studying explicit technological relationships

Higham, K., Contisciani, M., & De Bacco, C. (2022). Multilayer patent citation networks: A comprehensive analytical framework for studying explicit technological relationships. Technological Forecasting and Social Change, 179: 121628. doi:10.1016/j.techfore.2022.121628.

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https://doi.org/10.1016/j.techfore.2022.121628 (Publisher version)
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Not specified
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OA-Status:
Green

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 Creators:
Higham, Kyle1, Author
Contisciani, Martina2, Author                 
De Bacco, Caterina2, Author                 
Affiliations:
1External Organizations, ou_persistent22              
2Max Planck Research Group Physics for Inference and Optimization, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_3031010              

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Free keywords: Forschungsgruppe De Bacco
 Abstract: -

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Language(s): eng - English
 Dates: 2022-03-312022-06
 Publication Status: Issued
 Pages: 17
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.techfore.2022.121628
arXiv: 2203.14479
BibTex Citekey: patent
 Degree: -

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Title: Technological Forecasting and Social Change
  Other : Technol. Forecasting Soc. Change
  Other : Technol. Forecasting Social Change
  Other : Technological Forecasting and Social Change : an international journal
  Other : Technological Forecasting & Social Change
  Abbreviation : TFSC
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : Elsevier
Pages: - Volume / Issue: 179 Sequence Number: 121628 Start / End Page: - Identifier: ISSN: 0040-1625
CoNE: https://pure.mpg.de/cone/journals/resource/0040-1625