GHz sample excitation at the ALBA-PEEM

Khaliq, Muhammad Waqa; Álvarez, José M.; Camps, Antonio; González, Nahikari; Ferrer, José; Martinez-Carboneres, Ana; Prat, Jordi; Ruiz Gómez, Sandra; Niño, Miguel Angel; Macià, Ferran; Aballe, Lucia; Foerster, Michael

doi:10.1016/j.ultramic.2023.113757

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GHz sample excitation at the ALBA-PEEM

Khaliq, M. W., Álvarez, J. M., Camps, A., González, N., Ferrer, J., Martinez-Carboneres, A., et al. (2023). GHz sample excitation at the ALBA-PEEM. Ultramicroscopy, 250: 113757, pp. 1-7. doi:10.1016/j.ultramic.2023.113757.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000D-4087-2 Version Permalink: https://hdl.handle.net/21.11116/0000-000D-4089-0

Genre: Journal Article

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Khaliq, Muhammad Waqa¹, Author
Álvarez, José M.¹, Author
Camps, Antonio¹, Author
González, Nahikari¹, Author
Ferrer, José¹, Author
Martinez-Carboneres, Ana¹, Author
Prat, Jordi¹, Author
Ruiz Gómez, Sandra², Author
Niño, Miguel Angel¹, Author
Macià, Ferran¹, Author
Aballe, Lucia¹, Author
Foerster, Michael¹, Author

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1External Organizations, ou_persistent22
2Spin3D: Three-Dimensional Magnetic Systems, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_3385536

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Abstract: We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup. © 2023

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Language(s): eng - English

Dates: Published Online: 2023-05-09Date issued: 2023-05-09

Publication Status: Issued

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Identifiers: DOI: 10.1016/j.ultramic.2023.113757
BibTex Citekey: Khaliq2023

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Title: Ultramicroscopy

Abbreviation : Ultramicroscopy

Source Genre: Journal

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Publ. Info: Amsterdam : Elsevier

Pages: - Volume / Issue: 250 Sequence Number: 113757 Start / End Page: 1 - 7 Identifier: ISSN: 0304-3991
CoNE: https://pure.mpg.de/cone/journals/resource/954925512451