English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Effect of grain boundaries on electrical conductivity in Ti(Co,Fe)Sb half Heusler thermoelectrics

Bueno Villoro, R., Wood, M., Luo, T., Bishara, H., Abdellaoui, L., Zavanelli, D., et al. (2022). Effect of grain boundaries on electrical conductivity in Ti(Co,Fe)Sb half Heusler thermoelectrics. Poster presented at European Conference on Thermoelectrics (ECT), Barcelona, Spain.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Bueno Villoro, Ruben1, Author           
Wood, Maxwell2, Author
Luo, Ting3, Author           
Bishara, Hanna4, Author           
Abdellaoui, Lamya1, Author           
Zavanelli, Duncan2, Author
Gault, Baptiste3, Author           
Snyder, Gerald Jeffrey5, Author           
Scheu, Christina1, Author           
Zhang, Siyuan1, Author           
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Northwestern University, Clark Street 633, 60208, Evanston, USA, ou_persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
4Thin Films and Nanostructured Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_3274276              
5Northwestern University, Materials Science and Engineering Department, 2220 Campus Drive, Evanston, IL, 60208-3109, USA, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2022-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: European Conference on Thermoelectrics (ECT)
Place of Event: Barcelona, Spain
Start-/End Date: 2022-09-14 - 2022-09-16

Legal Case

show

Project information

show

Source

show