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  Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy

Suyolcu, Y. E., Wang, Y., Baiutti, F., Sigle, W., Cristiani, G., Gregori, G., et al. (2018). Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy. JEOL News, 53, 8-17.

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 Creators:
Suyolcu, Y. E., Author
Wang, Y.1, Author           
Baiutti, F., Author
Sigle, W:, Author
Cristiani, G.2, Author           
Gregori, G.3, Author           
Logvenov, G.2, Author           
Maier, J.3, Author           
van Aken, P. A.4, Author           
Affiliations:
1Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481              
2Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370497              
3Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370483              
4Scientific Facility Stuttgart Center for Electron Microscopy (Peter A. van Aken), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370493              

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 Dates: 2018
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 744848
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Title: JEOL News
Source Genre: Journal
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Pages: - Volume / Issue: 53 Sequence Number: - Start / End Page: 8 - 17 Identifier: -