High dose efficiency atomic resolution imaging via electron ptychography

Pennycook, T. J.; Martinez, G. T.; Nellist, P. D.; Meyer, J. C.

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High dose efficiency atomic resolution imaging via electron ptychography

Pennycook, T. J., Martinez, G. T., Nellist, P. D., & Meyer, J. C. (2018). High dose efficiency atomic resolution imaging via electron ptychography. Ultramicroscopy, 196, 243-248.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-D416-A Version Permalink: https://hdl.handle.net/21.11116/0000-000E-D417-9

Genre: Journal Article

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Creators:
Pennycook, T. J.¹, Author
Martinez, G. T., Author
Nellist, P. D., Author
Meyer, J. C.^{2, 3}, Author

Affiliations:
1Max Planck Society, ou_persistent13
2Research Group Solid State Nanophysics (Jurgen H. Smet), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370489
3Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370504

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Language(s): eng - English

Dates: Date issued: 2018

Publication Status: Issued

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Rev. Type: Internal

Identifiers: eDoc: 745016

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Title: Ultramicroscopy

Source Genre: Journal

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Pages: - Volume / Issue: 196 Sequence Number: - Start / End Page: 243 - 248 Identifier: -