Deutsch
 
Hilfe Datenschutzhinweis Impressum
  DetailsucheBrowse

Datensatz

 
 
DownloadE-Mail
  Observation of the variations of the domain structure of a spontaneous electric field in a two-dimensional electron system under microwave irradiation

Dorozhkin, S., Umansky, V., v. Klitzing, K., & Smet, J. (2017). Observation of the variations of the domain structure of a spontaneous electric field in a two-dimensional electron system under microwave irradiation. JETP Letters, 104(10), 721-725.

Item is

Basisdaten

einblenden: ausblenden:
Genre: Zeitschriftenartikel

Externe Referenzen

einblenden:

Urheber

einblenden:
ausblenden:
 Urheber:
Dorozhkin, S., Autor
Umansky, V., Autor
v. Klitzing, K.1, Autor
Smet, J.2, 3, Autor           
Affiliations:
1Max Planck Society, ou_persistent13              
2Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370504              
3Research Group Solid State Nanophysics (Jurgen H. Smet), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370489              

Inhalt

einblenden:
ausblenden:
Schlagwörter: -
 Zusammenfassung: It has been found on a sample of the GaAs/AlGaAs heterostructure with the two-dimensional electron system that different configurations of domains of a spontaneous electric field are possible within one microwave- induced state with the resistance tending to zero. Transitions between such configurations are observed at the variation of the radiation power and magnetic field. In the general case, the configuration of domains is more complicated than existing models. The fragment of the distribution of the electric field in the sample for one of the observed configurations is in agreement with the rhombic domain structure considered by I. G. Finkler and B. I. Halperin, Phys. Rev. B 79, 085315 (2009).

Details

einblenden:
ausblenden:
Sprache(n): eng - English
 Datum: 2017
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: eDoc: 735087
ISI: 000394539300012
 Art des Abschluß: -

Veranstaltung

einblenden:

Entscheidung

einblenden:

Projektinformation

einblenden:

Quelle 1

einblenden:
ausblenden:
Titel: JETP Letters
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: NEW YORK : MAIK NAUKA/INTERPERIODICA/SPRINGER
Seiten: - Band / Heft: 104 (10) Artikelnummer: - Start- / Endseite: 721 - 725 Identifikator: ISSN: 0021-3640