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  Refractive index measurements of photoresists for three-dimensional direct laser writing

Gissibl, T., Wagner, S., Sykora, J., Schmid, M., & Giessen, H. (2017). Refractive index measurements of photoresists for three-dimensional direct laser writing. Optical Materials Express, 7(7), 2293-2298.

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 Creators:
Gissibl, T., Author
Wagner, S., Author
Sykora, J.1, Author
Schmid, M.2, Author           
Giessen, H.3, Author           
Affiliations:
1Max Planck Society, ou_persistent13              
2Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370504              
3Former Research Groups, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370500              

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 Abstract: Femtosecond 3D printing is an important technology for manufacturing of nano-and microscopic devices and elements. Crucial for the design of such structures is the detailed knowledge of the refractive index in the visible and near-infrared spectral range and its dispersion. Here, we characterize 5 photoresists that are used with femtosecond 3D direct laser writers, namely IP-S, IP-Dip, IP-L, IP-G, and OrmoComp with a modified and automized Pulfrich refractometer setup, utilizing critical angles of total internal reflection. We achieve an accuracy of 5 . 10(-4) and reference our values to a BK-7 glass plate. We also give Abbe numbers and Schott Catalog numbers of the different resists. Their refractive indices are in the 1.49-1.57 range, while their Abbe numbers are in the range between 35 and 51. (C) 2017 Optical Society of America

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Language(s): eng - English
 Dates: 2017
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 734983
ISI: 000404735600017
 Degree: -

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Title: Optical Materials Express
Source Genre: Journal
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Publ. Info: WASHINGTON : OPTICAL SOC AMER
Pages: - Volume / Issue: 7 (7) Sequence Number: - Start / End Page: 2293 - 2298 Identifier: ISSN: 2159-3930