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  A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements

Bisoyi, S., Rödel, R., Zschieschang, U., Kang, M., Takimiya, K., Klauk, H., et al. (2016). A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements. Semiconductor Science and Technology, 31(2): 025011.

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 Creators:
Bisoyi, S., Author
Rödel, R., Author
Zschieschang, U.1, Author           
Kang, M., Author
Takimiya, K., Author
Klauk, H.1, Author           
Tiwari, S., Author
Affiliations:
1Research Group Organic Electronics (Hagen Klauk), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370488              

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Language(s): eng - English
 Dates: 2016
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 723715
ISI: 000372412900013
 Degree: -

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Title: Semiconductor Science and Technology
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 31 (2) Sequence Number: 025011 Start / End Page: - Identifier: ISSN: 0268-1242