A new setup for high resolution fast X-ray reflectivity data acquisition

Lippmann, M.; Buffet, A.; Pflaum, K.; Ehnes, A.; Ciobanu, A.; Seeck, O.

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A new setup for high resolution fast X-ray reflectivity data acquisition

Lippmann, M., Buffet, A., Pflaum, K., Ehnes, A., Ciobanu, A., & Seeck, O. (2016). A new setup for high resolution fast X-ray reflectivity data acquisition. Review of Scientific Instruments, 87(11): 113904.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-D1A8-8 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-D1A9-7

Genre: Journal Article

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Creators:
Lippmann, M., Author
Buffet, A., Author
Pflaum, K.¹, Author
Ehnes, A., Author
Ciobanu, A., Author
Seeck, O., Author

Affiliations:
1Max Planck Society, ou_persistent13

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Language(s): eng - English

Dates: Date issued: 2016

Publication Status: Issued

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Rev. Type: Internal

Identifiers: eDoc: 723777
ISI: 000390242300349

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 87 (11) Sequence Number: 113904 Start / End Page: - Identifier: ISSN: 0034-6748