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  Effect of low-damage inductively coupled plasma on shallow nitrogen-vacancy centers in diamond

de Oliveira, F., Momenzadeh, S., Wang, Y., Konuma, M., Markham, M., Edmonds, A., et al. (2015). Effect of low-damage inductively coupled plasma on shallow nitrogen-vacancy centers in diamond. Applied Physics Letters, 107(7): 073107.

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de Oliveira, F., Autor
Momenzadeh, S., Autor
Wang, Y.1, Autor           
Konuma, M.1, 2, Autor           
Markham, M., Autor
Edmonds, A., Autor
Denisenko, A., Autor
Wrachtrup, J., Autor
Affiliations:
1Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481              
2Scientific Facility Interface Analysis (Ulrich Starke), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370498              

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 Zusammenfassung: Near-surface nitrogen-vacancy (NV) centers in diamond have been successfully employed as atomic-sized magnetic field sensors for external spins over the last years. A key challenge is still to develop a method to bring NV centers at nanometer proximity to the diamond surface while preserving their optical and spin properties. To that aim we present a method of controlled diamond etching with nanometric precision using an oxygen inductively coupled plasma process. Importantly, no traces of plasma-induced damages to the etched surface could be detected by X-ray photoelectron spectroscopy and confocal photoluminescence microscopy techniques. In addition, by profiling the depth of NV centers created by 5.0 keV of nitrogen implantation energy, no plasma-induced quenching in their fluorescence could be observed. Moreover, the developed etching process allowed even the channeling tail in their depth distribution to be resolved. Furthermore, treating a C-12 isotopically purified diamond revealed a threefold increase in T-2 times for NV centers with <4 nm of depth (measured by nuclear magnetic resonance signal from protons at the diamond surface) in comparison to the initial oxygen-terminated surface. (C) 2015 AIP Publishing LLC.

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Sprache(n): eng - English
 Datum: 2015
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Interne Begutachtung
 Identifikatoren: eDoc: 713725
ISI: 000360390500050
 Art des Abschluß: -

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Titel: Applied Physics Letters
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 107 (7) Artikelnummer: 073107 Start- / Endseite: - Identifikator: ISSN: 0003-6951