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  Bias-stress stability of low-voltage p-channel and n-channel organic thin-film transistors on flexible plastic substrates

Bisoyi, S., Zschieschang, U., Kang, M. J., Takimiya, K., Klauk, H., & Tiwari, S. P. (2014). Bias-stress stability of low-voltage p-channel and n-channel organic thin-film transistors on flexible plastic substrates. Organic Electronics, 15(11), 3173-3182.

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Bisoyi, S., Author
Zschieschang, U.1, Author           
Kang, M. J., Author
Takimiya, K., Author
Klauk, H.1, Author           
Tiwari, S. P., Author
Affiliations:
1Research Group Organic Electronics (Hagen Klauk), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370488              

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Language(s): eng - English
 Dates: 2014
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 698655
ISI: 000344424500070
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Title: Organic Electronics
Source Genre: Journal
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Pages: - Volume / Issue: 15 (11) Sequence Number: - Start / End Page: 3173 - 3182 Identifier: ISSN: 1566-1199