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  Element Specific Monolayer Depth Profiling

Macke, S., Radi, A., Hamann-Borrero, J. E., Verna, A., Bluschke, M., Brück, S., et al. (2014). Element Specific Monolayer Depth Profiling. Advanced Materials, 26(38), 6554-6559.

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 Creators:
Macke, S., Author
Radi, A., Author
Hamann-Borrero, J. E., Author
Verna, A., Author
Bluschke, M., Author
Brück, S., Author
Goering, E., Author
Sutarto, R., Author
He, F., Author
Cristiani, G.1, Author           
Wu, M., Author
Benckiser, E., Author
Habermeier, H.-U.1, 2, 3, Author           
Logvenov, G.1, Author           
Gauquelin, N., Author
Botton, G. A., Author
Kajdos, A. P., Author
Stemmer, S., Author
Sawatzky, G. A.4, 5, Author           
Haverkort, M. W., Author
Keimer, B.2, Author           Hinkov, V.2, Author            more..
Affiliations:
1Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370497              
2Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370480              
3Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370483              
4External Scientific Members, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370506              
5Miscellaneous, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370507              

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Language(s): eng - English
 Dates: 2014
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 698642
ISI: 000343763200004
 Degree: -

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Title: Advanced Materials
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 26 (38) Sequence Number: - Start / End Page: 6554 - 6559 Identifier: ISSN: 0935-9648