Towards precise defect control in layered oxide structures by using oxide 
molecular beam epitaxy

Baiutti, F.; Christiani, G.; Logvenov, G.

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Towards precise defect control in layered oxide structures by using oxide molecular beam epitaxy

Baiutti, F., Christiani, G., & Logvenov, G. (2014). Towards precise defect control in layered oxide structures by using oxide molecular beam epitaxy. Beilstein Journal of Nanotechnology, 5, 596-602.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-000E-C8A0-B Versions-Permalink: https://hdl.handle.net/21.11116/0000-000E-C8A1-A

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Urheber:
Baiutti, F., Autor
Christiani, G., Autor
Logvenov, G.¹, Autor

Affiliations:
1Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370497