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  AC characterization of organic thin-film transistors with asymmetric gate-to-source and gate-to-drain overlaps

Zaki, T., Rödel, R., Letzkus, F., Richter, H., Zschieschang, U., Klauk, H., et al. (2013). AC characterization of organic thin-film transistors with asymmetric gate-to-source and gate-to-drain overlaps. Organic Electronics, 14(5), 1318-1322.

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Zaki, T., Author
Rödel, R., Author
Letzkus, F., Author
Richter, H., Author
Zschieschang, U.1, Author           
Klauk, H.1, Author           
Burghartz, J. N., Author
Affiliations:
1Research Group Organic Electronics (Hagen Klauk), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370488              

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 Abstract: This paper presents S-parameter characterization and a corresponding physics-based small-signal equivalent circuit for organic thin-film transistors (OTFTs). Furthermore, the impact of misalignment between the source/drain contacts and the patterned gate on the dynamic TFT performance is explored and a simple method to estimate the misalignment from the measured S-parameters is proposed. An excellent fit between theoretical and experimental S-parameters is demonstrated. For this study, OTFTs based on the air-stable organic semiconductor dinaphtho[2,3-b:2',3'-f]thieno[3,2-b]thiophene (DNTT) having a channel length of 1 mu m and a gate-to-contact overlap of 5 or 20 mu m and being operated at a supply voltage of 3 V are utilized. The intentional asymmetry between gate-to-source and gate-to-drain overlaps is precisely controlled by the use of high-resolution silicon stencil masks. (C) 2013 Elsevier B. V. All rights reserved.

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Language(s): eng - English
 Dates: 2013
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 672265
ISI: 000317825800015
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Title: Organic Electronics
Source Genre: Journal
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Pages: - Volume / Issue: 14 (5) Sequence Number: - Start / End Page: 1318 - 1322 Identifier: ISSN: 1566-1199