Quantitative mapping of fast voltage pulses in tunnel junctions by plasmonic 
luminescence

Grosse, C.; Etzkorn, M.; Kuhnke, K.; Loth, S.; Kern, K.

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Quantitative mapping of fast voltage pulses in tunnel junctions by plasmonic luminescence

Grosse, C., Etzkorn, M., Kuhnke, K., Loth, S., & Kern, K. (2013). Quantitative mapping of fast voltage pulses in tunnel junctions by plasmonic luminescence. Applied Physics Letters, 103(18): 183108.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-C4FB-A Version Permalink: https://hdl.handle.net/21.11116/0000-000E-C4FC-9

Genre: Journal Article

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Creators:
Grosse, C., Author
Etzkorn, M., Author
Kuhnke, K.¹, Author
Loth, S.^{2, 3}, Author
Kern, K.¹, Author

Affiliations:
1Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481
2Dynamics of Nanoelectronic Systems, Research Groups, Max Planck Research Department for Structural Dynamics, Department of Physics, University of Hamburg, External Organizations, ou_2173642
3Max Planck Institute for Solid State Research, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2013

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 673206
ISI: 000327816000055

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 103 (18) Sequence Number: 183108 Start / End Page: - Identifier: ISSN: 0003-6951