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  Growth mode and atomic structure of MnSi thin films on Si(111)

Geisler, B., Kratzer, P., Suzuki, T., Lutz, T., Costantini, G., & Kern, K. (2012). Growth mode and atomic structure of MnSi thin films on Si(111). Physical Review B, 86(11): 115428.

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 Creators:
Geisler, B., Author
Kratzer, P., Author
Suzuki, T., Author
Lutz, T., Author
Costantini, G.1, Author           
Kern, K.1, Author           
Affiliations:
1Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481              

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 Abstract: Thin films of MnSi(111) in B20 structure formed by reactive epitaxy on Si(111) are studied using scanning tunneling microscopy (STM) and density functional theory calculations. Coexisting root 3 x root 3 structures with high or low corrugation are observed and assigned to different Mn coverage by using a detailed analysis of simulated STM images. Comparison with our interpretation of STM images of films previously grown by codeposition of Mn and Si provides us with evidence that the stacking sequence of Mn and Si lattice planes depends on the growth protocol.

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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 632957
ISI: 000308866700005
 Degree: -

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Title: Physical Review B
Source Genre: Journal
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Pages: - Volume / Issue: 86 (11) Sequence Number: 115428 Start / End Page: - Identifier: ISSN: 1098-0121