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  A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields

White, S. C., Singh, U. R., & Wahl, P. (2011). A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields. Review of Scientific Instruments, 82(11): 113708.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-C0DB-2 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-C0DC-1
Genre: Journal Article

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 Creators:
White, S. C., Author
Singh, U. R., Author
Wahl, P.1, 2, Author           
Affiliations:
1Former Research Groups, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370500              
2Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481              

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 Abstract: We have developed a measurement head for scanning tunneling microscopy (STM) and specifically for spectroscopic imaging STM which is optimized for high mechanical stiffness and good thermal conductivity by choice of material. The main components of the microscope head are made of sapphire. Sapphire has been chosen from several competing possibilities based on finite element modeling of the fundamental vibrational modes of the body. We demonstrate operation of the STM head in topographic imaging and tunneling spectroscopy at temperatures down to below 2 K. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3663611].

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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 581086
ISI: 000297941100028
 Degree: -

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Title: Review of Scientific Instruments
  Alternative Title : Rev. Sci. Instrum.
Source Genre: Journal
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Publ. Info: MELVILLE : AMER INST PHYSICS
Pages: - Volume / Issue: 82 (11) Sequence Number: 113708 Start / End Page: - Identifier: ISSN: 0034-6748