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  Thin Films of Ge-Sb-Te-Based Phase Change Materials: Microstructure and in Situ Transformation

Tomforde, J., Bensch, W., Kienle, L., Duppel, V., Merkelbach, P., & Wuttig, M. (2011). Thin Films of Ge-Sb-Te-Based Phase Change Materials: Microstructure and in Situ Transformation. Chemistry of Materials, 23(17), 3871-3878.

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 Creators:
Tomforde, J., Author
Bensch, W., Author
Kienle, L.1, 2, Author           
Duppel, V.1, 2, Author           
Merkelbach, P., Author
Wuttig, M., Author
Affiliations:
1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502              
2Department Nanochemistry (Bettina V. Lotsch), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370482              

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Free keywords: phase change materials; microstructure; phase transition; HRTEM
 Abstract: The ternary compounds GeSb(2)Te(4) and Ge(2)Sb(2)Te(4) are promising phase change materials for application in the fields of data storage and recording. In the present study, thin films of the materials were deposited. on inert substrates using the magnetron sputter technique. The microstructures, of the amorphous, metastable, and stable crystalline states were investigation X-ray powder diffractometry and high resolution transmission electron microscopy (HRTEM). In the as-deposited state, the materials are amorphous. Upon heating, they crystallize first into a metastable phase with a NaCl-type structure, followed by a transformation into a layered structure (stable phase) at higher temperatures. HRTEM studies reveal that nanosized particles with a granular morphology are present in all materials for the crystalline metastable state. In the case of GeSb(2)Te(4), these nanocrystals do not grow significantly when the sample transforms to the stable phase, which contains layers of structural vacancy. Ge(2)Sb(2)Te(4) behaves differently. In particular, the structural transition to the crystalline stable phase is accompanied by a pronounced increase in the crystallite size up to several Micrometers. The crystals are built from nanoscale lamellae, which do not contain vacancy layers. Rietveld refinement of the X-ray data of Ge(2)Sb(2)Te(4) in the metastable crystalline state reveals that the compound consists of two phases of which one is Ge rich and the other Ge poor. The size of the coherent scattering domains in the former phase was about 20 nm, whereas the value for the second phase was determined to be about 2 nm.

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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 581131
ISI: 000294647700010
 Degree: -

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Title: Chemistry of Materials
  Alternative Title : Chem. Mat.
Source Genre: Journal
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Publ. Info: WASHINGTON : AMER CHEMICAL SOC
Pages: - Volume / Issue: 23 (17) Sequence Number: - Start / End Page: 3871 - 3878 Identifier: ISSN: 0897-4756