Charge transport and magnetization profile at the interface between the 
correlated metal CaRuO3 and the antiferromagnetic insulator CaMnO3

Freeland, J. W.; Chakhalian, J.; Boris, A. V.; Tonnerre, J. M.; Kavich, J. J.; Yordanov, P.; Grenier, S.; Zschack, P.; Karapetrova, E.; Popovich, P.; Lee, H. N.; Keimer, B.

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Charge transport and magnetization profile at the interface between the correlated metal CaRuO₃ and the antiferromagnetic insulator CaMnO₃

Freeland, J. W., Chakhalian, J., Boris, A. V., Tonnerre, J. M., Kavich, J. J., Yordanov, P., et al. (2010). Charge transport and magnetization profile at the interface between the correlated metal CaRuO₃ and the antiferromagnetic insulator CaMnO₃. Physical Review B, 81(9): 094414.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-BF1F-A Version Permalink: https://hdl.handle.net/21.11116/0000-000E-BF20-7

Genre: Journal Article

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Creators:
Freeland, J. W., Author
Chakhalian, J.¹, Author
Boris, A. V.¹, Author
Tonnerre, J. M., Author
Kavich, J. J., Author
Yordanov, P.^{1, 2}, Author
Grenier, S., Author
Zschack, P., Author
Karapetrova, E., Author
Popovich, P., Author
Lee, H. N., Author
Keimer, B.¹, Author

Affiliations:
1Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370480
2Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370497

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Language(s): eng - English

Dates: Date issued: 2010

Publication Status: Issued

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Identifiers: eDoc: 479220
ISI: 000276207300064

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Title: Physical Review B

Source Genre: Journal

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Pages: - Volume / Issue: 81 (9) Sequence Number: 094414 Start / End Page: - Identifier: ISSN: 1098-0121