Charge transport and magnetization profile at the interface between the 
correlated metal CaRuO3 and the antiferromagnetic insulator CaMnO3

Freeland, J. W.; Chakhalian, J.; Boris, A. V.; Tonnerre, J. M.; Kavich, J. J.; Yordanov, P.; Grenier, S.; Zschack, P.; Karapetrova, E.; Popovich, P.; Lee, H. N.; Keimer, B.

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Charge transport and magnetization profile at the interface between the correlated metal CaRuO₃ and the antiferromagnetic insulator CaMnO₃

Freeland, J. W., Chakhalian, J., Boris, A. V., Tonnerre, J. M., Kavich, J. J., Yordanov, P., et al. (2010). Charge transport and magnetization profile at the interface between the correlated metal CaRuO₃ and the antiferromagnetic insulator CaMnO₃. Physical Review B, 81(9): 094414.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-000E-BF1F-A Versions-Permalink: https://hdl.handle.net/21.11116/0000-000E-BF20-7

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Urheber:
Freeland, J. W., Autor
Chakhalian, J.¹, Autor
Boris, A. V.¹, Autor
Tonnerre, J. M., Autor
Kavich, J. J., Autor
Yordanov, P.^{1, 2}, Autor
Grenier, S., Autor
Zschack, P., Autor
Karapetrova, E., Autor
Popovich, P., Autor
Lee, H. N., Autor
Keimer, B.¹, Autor

Affiliations:
1Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370480
2Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370497