Parametric Rietveld refinement for the evaluation of powder diffraction 
patterns collected as a function of pressure

Halasz, I.; Dinnebier, R. E.; Angel, R.

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Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure

Halasz, I., Dinnebier, R. E., & Angel, R. (2010). Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure. Journal of Applied Crystallography, 43, 504-510.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-BBFA-6 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-BBFB-5

Genre: Journal Article

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Creators:
Halasz, I., Author
Dinnebier, R. E.¹, Author
Angel, R., Author

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1Scientific Facility X-Ray Diffraction (Robert E. Dinnebier), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370494

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Language(s): eng - English

Dates: Date issued: 2010

Publication Status: Issued

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Identifiers: eDoc: 479184
ISI: 000277392600015

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Title: Journal of Applied Crystallography

Source Genre: Journal

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Pages: - Volume / Issue: 43 Sequence Number: - Start / End Page: 504 - 510 Identifier: ISSN: 0021-8898